With our Focused Ion Beam (FIB) system we can repair/modify your ICs.
We offer full front and backside FIB edit service using the latest FIB systems. We have state of the art sample decapsulation tools and know how to prepare the samples for the actual FIB edit. We have more than 20 years experience with FIB circuit edits and we have done several successful projects on process nodes down to 16nm.
Our goal is to make your chip work!!
- Decapsulation and re-encapsulation
- GDS based navigation
- Front & backside edits
- Low resistance metal deposition
- Insulator deposition
- Support for all IC processes
- Be 100% sure that your well-thought-out modification really fixes the issue
- Be sure that the initial issue was not masking other (unknown) issues
- Reduce the time to market
- Having working samples before the final silicon arrives so your application team can progress
- Meeting agreed deadlines with key customers
Need more information?
Detailed technical information can be found in our FIB Circuit Edit Services leaflet: